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Error mapping of CMMs and machine tools by a single tracking interferometer

机译:单个跟踪干涉仪对三坐标测量机和机床的误差映射

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摘要

This paper presents a novel approach for the mapping of geometric errors of machine tools and coordinate measuring machines by a single tracking interferometer. The concept is based on interferometric displacement measurements between reference points that are fixed to the base and offset points fixed to the machine head. The experimental comparison with an independent technique on a high accuracy CMM demonstrated the agreement of parameters in the sub-micron range. Thus, the method proved to be suitable for the highest accuracy demands. Furthermore, it has almost no limitation for the maximum size of the working volume. It does not require any alignment of equipment and yields a very simple data structure, which can be evaluated by the developed software with very little additional information from the operator. The method has also been tested on a large horizontal arm machine and on a smaller high precision machine tool.
机译:本文提出了一种通过单跟踪干涉仪映射机床和坐标测量机的几何误差的新颖方法。该概念基于固定在基础上的参考点与固定在机头上的偏置点之间的干涉式位移测量。在高精度三坐标测量机上使用独立技术进行的实验比较表明,参数在亚微米范围内是一致的。因此,该方法被证明适合于最高的精度要求。此外,对于工作体积的最大尺寸几乎没有限制。它不需要设备的任何对准,并且产生非常简单的数据结构,该数据结构可以由开发的软件进行评估,而操作员只需很少的附加信息即可。该方法还已经在大型水平臂机床和较小的高精度机床上进行了测试。

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