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首页> 外文期刊>Human mutation >Double-strand DNA break repair with replication slippage on two strands: a novel mechanism of deletion formation.
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Double-strand DNA break repair with replication slippage on two strands: a novel mechanism of deletion formation.

机译:双链DNA断裂修复与两条链上的复制滑动:删除形成的新机制。

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摘要

We have characterized an unusual family with two different androgen receptor (AR) gene deletions, in which we propose a novel mechanism of deletion formation has occurred. Affected individuals have the X-linked disorder androgen insensitivity syndrome, and we previously showed that different family members have deletions of different exons of the AR gene. We have now fully sequenced the deletions from affected individuals, and confirmed the presence of different deletions in different affected family members. Most affected and heterozygote individuals have a 4,430-bp deletion of exon 5 that occurred between repeated GTGGCAT motifs in introns 4 and 5. One affected hemizygous individual has a 4,033-bp deletion of exons 6 and 7 that occurred between repeated CCTC motifs in introns 5 and 7. The intron 5 breakpoint junctions of the two deletions are only 11 bp apart. Surprisingly, the maternal grandmother of the original index case was found to be mosaic for both deletional events, as well as having the normal AR gene. Karyotyping ruled out 47,XXX trisomy, indicating triple mosaicism for the two different deleted AR alleles and a normal AR allele. This triple mosaicism must have occurred early in embryonic development, as both deletions were passed on to different children. Based on these findings, we propose a novel mechanism of deletion formation. We suggest that during AR gene replication, a double strand DNA break occurred in intron 5, and that a variant of replication slippage occurred on both newly synthesized strands between the repeat motifs of microhomology, leading to the formation of the two different AR gene deletions.
机译:我们已经表征了一个不寻常的家族,具有两个不同的雄激素受体(AR)基因缺失,其中我们提出了一种新的缺失形成机制。受影响的人患有X连锁障碍雄激素不敏感综合症,我们以前曾证明不同的家庭成员具有AR基因不同外显子的缺失。现在,我们已对受影响个体的缺失进行了完全测序,并确认了在不同的受影响家庭成员中存在不同的缺失。大多数受影响和杂合子个体在内含子4和5的重复GTGGCAT基序之间发生了外显子5的4,430-bp缺失。一个受影响的半合子个体在内含子5的重复CCTC基序之间发生了外显子6和7的4,033-bp缺失。 7.两个缺失的内含子5个断裂点连接仅相隔11bp。出乎意料的是,原始索引病例的祖母被发现既有缺失事件,又有正常的AR基因。核型分析排除了47,XXX三体性,表明两个不同的缺失AR等位基因和一个正常AR等位基因具有三重嵌合性。这种三重镶嵌必定发生在胚胎发育的早期,因为这两个缺失都传递给了不同的孩子。基于这些发现,我们提出了一种新的缺失形成机制。我们建议在AR基因复制过程中,内含子5中发生双链DNA断裂,并且在微观同源性的重复基序之间的两条新合成链上发生复制滑移的变体,从而导致形成两个不同的AR基因缺失。

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