首页> 外文期刊>Human Genetics >A novel approach for identifying candidate imprinted genes through sequence analysis of imprinted and control genes.
【24h】

A novel approach for identifying candidate imprinted genes through sequence analysis of imprinted and control genes.

机译:通过对印迹基因和对照基因进行序列分析来鉴定候选印迹基因的新方法。

获取原文
获取原文并翻译 | 示例
       

摘要

Through the sequence analysis of 27 imprinted human genes and a set of 100 control genes we have developed a novel approach for identifying candidate imprinted genes based on the differences in sequence composition observed. The imprinted genes were found to be associated with significantly reduced numbers of short interspersed transposable element (SINE) Alus and mammalian-wide interspersed repeat (MIR) repeat elements, as previously reported. In addition, a significant association between imprinted genes and increased numbers of low-complexity repeats was also evident. Numbers of the Alu classes AluJ and AluS were found to be significantly depleted in some parts of the flanking regions of imprinted genes. A recent study has proposed that there is active selection against SINE elements in imprinted regions. Alternatively, there may be differences in the rates of insertion of Alu elements. Our study indicates that this difference extends both upstream and downstream of the coding region. This and other consistent differences between the sequence characteristics of imprinted and control genes has enabled us to develop discriminant analysis, which can be used to screen the genome for candidate imprinted genes. We have applied this function to a number of genes whose imprinting status is disputed or uncertain.
机译:通过对27个印迹人类基因和一组100个对照基因的序列分析,我们开发了一种基于观察到的序列组成差异来鉴定候选印迹基因的新颖方法。如先前报道,发现印迹基因与短散布的转座因子(SINE)Alus和哺乳动物全散布的重复序列(MIR)重复元件的数量显着减少有关。此外,印迹基因与低复杂度重复序列数目增加之间也存在明显的关联。发现在印迹基因的侧翼区域的某些部分中,Alu类AluJ和AluS的数量显着减少。最近的一项研究提出,在印记区域中存在针对SINE元素的主动选择。或者,Alu元素的插入速率可能有所不同。我们的研究表明,这种差异扩展了编码区域的上游和下游。印迹基因和对照基因的序列特征之间的这种以及其他一致的差异使我们能够进行判别分析,该分析可用于筛选基因组中候选印迹基因。我们已将此功能应用于印迹状态有争议或不确定的许多基因。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号