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Anticorrelation between Surface and Subsurface Point Defects and the Impact on the Redox Chemistry of TiO2(110)

机译:表面和亚表面点缺陷之间的反相关性及其对TiO2(110)氧化还原化学的影响

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摘要

By using a combination of scanning tunneling microscopy (STM), density functional theory (DFT), and secondary-ion mass spectroscopy (SIMS), we explored the interplay and relative impact of surface versus subsurface defects on the surface chemistry of rutile TiO2. STM results show that surface O vacancies (V-O) are virtually absent in the vicinity of positively charged subsurface point defects. This observation is consistent with DFT calculations of the impact of subsurface defect proximity on V-O formation energy. To monitor the influence of such lateral anticorrelation on surface redox chemistry, a test reaction of the dissociative adsorption of O-2 was employed and was observed to be suppressed around them. DFT results attribute this to a perceived absence of intrinsic (Ti), and likely extrinsic interstitials in the nearest subsurface layer beneath inhibited areas. We also postulate that the entire nearest subsurface region could be devoid of any charged point defects, whereas prevalent surface defects (V-O) are largely responsible for mediation of the redox chemistry at the reduced TiO2(110).
机译:通过结合使用扫描隧道显微镜(STM),密度泛函理论(DFT)和二次离子质谱(SIMS),我们研究了表面缺陷与次表面缺陷对金红石TiO2表面化学的相互作用和相对影响。 STM结果表明,在带正电的亚表面点缺陷附近,几乎没有表面O空位(V-O)。此观察结果与DFT计算得出的地下缺陷邻近度对V-O形成能的影响是一致的。为了监测这种横向反相关对表面氧化还原化学的影响,采用了O-2的解离吸附的测试反应,并观察到它们被抑制了。 DFT结果将其归因于感知不到的本征(Ti),以及受抑制区域下方最近的地下层中可能存在的本征间隙。我们还假设,整个最近的次表面区域可能没有任何带电点缺陷,而普遍的表面缺陷(V-O)很大程度上是还原TiO2(110)上氧化还原化学作用的中介。

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