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Vacuum Ultraviolet Radiation in Sources of Hyperthermal Atomic Oxygen.Photodestruction of Polytetrafluoroethylene (PTFE) and Teflon FEP for Indication of this Radiation

机译:高温原子氧源中的真空紫外辐射。聚四氟乙烯(PTFE)和聚四氟乙烯FEP的光解法表明了这种辐射

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Most facilities for testing the stability of spacecraft materials under attack by fast atomic oxygen (AO) are based on the generation of hypersonic beams of AO in nozzle sources with the use of continuous electrical discharges or in laser pulse-induced breakdown of the gaseous oxygen.In both cases,the sources of fast AO are simultaneously quite intense sources of vacuum ultraviolet (VUV) radiation.In the present study the intensity of VUV radiation with wavelengths > 115 nm from fast AO source were directly measured in the Central Aerohydrodynamic Institute facility VAT-103.The intensity of this VUV radiation at the nozzle exit was shown to be almost equal to the intensity of the commercial lamp XeR-2 emitting at 147.0 nm (at its window).This VUV radiation can take part in destruction and erosion of polymer materials simulating the oxydative effects of fast AO.Its contribution to observed mass losses is greatly dependent on the material under test.For polymers consisting of carbon,hydrogen,oxygen and nitrogen the main role in erosion is played by fast AO.The decisive role of VUV radiation is shown in the erosion of fully fluorinated polymers.The mass losses of Teflon and Teflon FEP films in facilities for generation of fast AO are suggested as a means of measuring the VUV radiation dose in these facilities.The main features of mass losses that depend on duration of VUV irradiation are formulated.They are based on the previously proposed model of mass losses from these polymers during VUV photodestruction.The key feature of this model is the limited rate of photofragment evaporation (sublimation) into vacuum.
机译:大多数用于测试航天器材料在受到快速原子氧(AO)攻击下的稳定性的设施都是基于在喷嘴源中使用连续放电或激光脉冲诱导的气态氧分解产生的高超声速束。在这两种情况下,快速AO的源同时是相当强烈的真空紫外线(VUV)辐射源。在本研究中,来自快速AO的波长> 115 nm的VUV辐射强度直接在中央空气动力学研究所设施VAT中进行测量。 -103.VUV辐射在喷嘴出口处的强度几乎等于在147.0 nm处发射的商用灯XeR-2的强度(在其窗口处),该VUV辐射可破坏和侵蚀玻璃。模拟快速AO氧化作用的聚合物材料,它对观察到的质量损失的贡献在很大程度上取决于被测材料。对于由碳,氢组成的聚合物原子,氧和氮在侵蚀中的主要作用是由快速AO引起的。VUV辐射在全氟化聚合物的侵蚀中起着决定性的作用。作为测量这些设施中VUV辐射剂量的一种手段,制定了取决于VUV照射持续时间的质量损失的主要特征,它们基于先前提出的这些聚合物在VUV光解过程中的质量损失模型。该模型的特点是光碎片蒸发(升华)进入真空的速率有限。

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