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首页> 外文期刊>Wear: an International Journal on the Science and Technology of Friction, Lubrication and Wear >Microano-scale differential wear of multiphase materials: pole tip recession in magnetic-tape heads
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Microano-scale differential wear of multiphase materials: pole tip recession in magnetic-tape heads

机译:多相材料的微米/纳米微分磨损:磁头中的磁头尖端凹进

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摘要

Wear of multiphase materials at the microano-scale is important in devices such as magnetic tape and disk drives, where the read-write heads are multiphase. Differential wear, which is caused by differences in wear resistance among the heads' phases, causes the thin-film poles to recede from the bearing surface; this is called pole tip recession (PTR). It is a problem because it increases spacing between the poles and medium, resulting in lower readback amplitude. Here, PTR in tape heads is studied to understand microano-scale differential wear. Test results suggest that three-body abrasion, which leads to primarily plastic wear, is the operative wear mode. Most of the three-body abrasive particles originate from the tape surface; the alumina head-cleaning agents (HCAs) in the tape, which function as load bearing particles at the interface, are believed to be the primary abrasives. Some of the particles originate from the head. These are important if the substrate material is relatively soft. Differential wear can be reduced by choosing a substrate that is harder than the tape's HCAs, choosing a pole material that is as close as possible to the hardness of the substrate, and lowering the thickness of the head's thin-film region. Material hardness matching will not reduce differential wear if a substrate is chosen that is less hard than the HCAs. An analytical model that accounts for the observed wear is presented. The model shows that each of the following leads to higher differential wear: increasing the thickness of three-body particles, increasing tension, decreasing thin-film hardness, and increasing the thin-film wear coefficient. An increase in thin-film wear coefficient can be caused by an increase in thin-film thickness or an increase in the number of particles at the interface.
机译:在读写头是多相的设备(例如磁带和磁盘驱动器)中,微米/纳米级的多相材料的磨损很重要。磁头相之间的耐磨性差异引起的差异磨损会导致薄膜磁极从轴承表面退回。这就是所谓的极尖后退(PTR)。这是一个问题,因为它增加了磁极和介质之间的间距,从而导致较低的回读幅度。在这里,对磁带磁头中的PTR进行了研究,以了解微/纳米级的差异磨损。测试结果表明,三体磨损主要是塑性磨损,是可操作的磨损方式。三体磨料颗粒中的大多数都来自带表面。带中的氧化铝头清洁剂(HCA)被认为是主要的磨料,它们在界面上起承重颗粒的作用。一些颗粒来自头部。如果基底材料相对较软,这些就很重要。可以通过选择比胶带的HCA硬的基材,选择与基材的硬度尽可能接近的磁极材料以及减小磁头薄膜区域的厚度来减少差异磨损。如果选择的基材硬度低于HCA,则材料的硬度匹配不会降低差异磨损。提出了解释观察到的磨损的分析模型。该模型表明,以下各项都会导致较高的差异磨损:增加三体颗粒的厚度,增加张力,降低薄膜硬度以及增加薄膜磨损系数。薄膜磨损系数的增加可能是由于薄膜厚度的增加或界面处颗粒数量的增加。

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