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首页> 外文期刊>Carbon: An International Journal Sponsored by the American Carbon Society >The effect of electrolyte temperature on the passivity of solid electrolyte interphase formed on a graphite electrode
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The effect of electrolyte temperature on the passivity of solid electrolyte interphase formed on a graphite electrode

机译:电解质温度对在石墨电极上形成的固态电解质相间钝化度的影响

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摘要

The effect of electrolyte temperature on the passivity of solid electrolyte interphase (SEI) wasinvestigated in 1M LiPF_6-ethylene carbonate/diethyl carbonate (50:50 vol.%) electrolyte,using galvanostatic charge-discharge experiment,and ac-impedance spectroscopy combined with Fourier transform infra-red spectroscopy,and high resolution transmission electron microscopy (HRTEM).The gavanostatic charge-discharge curves at 20degC evidenced that the irreversible capacity loss during electrochemcial cycling was markedly increased with rising SEI formation temperature from 0 to 40degC.This implies that the higher the SEI formation temperature,the more were the graphite electrodes exposed to structural damages.From both increase of the relative amount of Li_2CO_3 to ROCO_2Li and decrease of resistance to the lithium transport through the SEI layer with increasing SEIformation temperature,it is reason able to claim that,due to the enhanced gas evolution reactions during transformation of ROCO_2Li to Li_2CO_3,the rising SEI formation temperature increased the number of defect sites in the SEI layer.From the analysis of HRTEM images,no significant structural destruction in bulk graphite layer was observed after charge-discharge cycles.This means that solvated lithium ions were intercalated through the defect sites in the SEI,at most,into the surface region of the graphite layer.
机译:利用恒电流充放电实验,交流阻抗谱和傅立叶相结合的方法,研究了1M LiPF_6-碳酸亚乙酯/碳酸二乙酯(50:50 vol。%)中电解质温度对固体电解质相(SEI)钝化率的影响。变换红外光谱和高分辨率透射电镜(HRTEM).20degC的恒静充放电曲线表明,随着SEI形成温度从0升高到40degC,电化学循环过程中不可逆容量损失显着增加。随着SEI形成温度的升高,Li_2CO_3与ROCO_2Li的相对含量增加,以及对锂通过SEI层的传输阻力的降低,SEI形成温度越高,石墨电极遭受的结构损伤越多。声称,由于ROCO_2转化过程中气体逸出反应的增强Li到Li_2CO_3,升高的SEI形成温度增加了SEI层中的缺陷位点数量。从HRTEM图像分析,充放电循环后未在块状石墨层中观察到明显的结构破坏。这意味着溶剂化的锂离子是最多通过SEI中的缺陷部位插入石墨层的表面区域。

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