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NOVEL APPLICATIONS OF TOPOLOGICAL INDICES .1. CORRELATION OF EDGE SHIFTS IN X-RAY ABSORPTION WITH WIENER INDICES

机译:拓扑指数的新应用.1。 X射线吸收中边缘位移与维纳指数的相关性

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摘要

A novel application of Wiener indices in estimating edge shifts is described. It is demonstrated that edge shifts in x-ray K absorption are linearly correlated with Wiener indices. Copper and cobalt complexes were used to establish this linearity. A novel technique of data reduction using topological indices was employed for the first time for correlation purposes in x-ray absorption studies. [References: 12]
机译:描述了维纳指数在估计边缘偏移中的一种新颖应用。证明了X射线吸收的边缘偏移与维纳指数线性相关。铜和钴配合物用于建立这种线性。在X射线吸收研究中,出于相关目的,首次采用了一种使用拓扑指数的数据缩减新技术。 [参考:12]

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