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Contribution of bremsstrahlung of free electrons to formation of the background component for NaK X-ray fluorescence

机译:自由电子的bre致辐射对NaK X射线荧光的背景成分形成的贡献

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摘要

Bremsstrahlung of free electrons (photo, Auger and Compton electrons) that occur in an irradiated sample is compared with probable components of the radiation background, such as diffuse scattering of the sample radiation by the analyzing crystal, X-ray fluorescence of the analyzing crystal and high orders of Bragg's reflection of the polychromatic primary radiation scattered in the sample under study. The comparison is performed within a range of NaKa line. It is revealed that response functions, represented by experimental intensities of background samples, are in good agreement with calculated summary values of the background intensity. The contributions of bremsstrahlung of free electrons to the formation of the background component of the analytical signal are estimated within the considered range of the X-ray fluorescence spectrum.
机译:将辐射样品中出现的自由电子(光,俄歇和康普顿电子)的ms致辐射与辐射背景的可能成分进行比较,例如分析晶体对样品辐射的散射,分析晶体的X射线荧光和研究样品中散射的多色主要辐射的布拉格反射的高阶。比较在NaKa线的范围内进行。结果表明,以背景样品的实验强度表示的响应函数与背景强度的计算摘要值非常吻合。在所考虑的X射线荧光光谱范围内,估算了自由电子的bre致辐射对分析信号的背景成分形成的贡献。

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