Measurement of background components in wavelength dispersive X-ray fluorescence spectrometry

摘要

Three components of the background have been investigated: first, characteristic radiation of the lamellas of the collimator excited by secondary x-ray beam; second, secondary x-ray beam scattered by the lamellas of the collimator; third, diffusive and incoherent scattering of the secondary x-ray beam by the focusing crystal. The relationships between chemical content of the specimen and the intensity of the first and the second components were determined by a wavelength-dispersive x-ray spectrometer that has an energy-dispersive x-ray detector. The intensity of the third component was very low. It was not found in this experiment. Copyright (c) 2006 John Wiley & Sons, Ltd.