首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >The relationship between end-group concentrations and stability of spin-coated thin polymer films investigated by ToF-SIMS depth profiling
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The relationship between end-group concentrations and stability of spin-coated thin polymer films investigated by ToF-SIMS depth profiling

机译:通过ToF-SIMS深度分析研究端基浓度与旋涂聚合物薄膜稳定性之间的关系

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摘要

Stable and unstable spin-coated polymer films were prepared using various solvents and substrates. The relationship between polymer end-group concentrations and stability of spin-coated polymer films was revealed by time-of-flight secondary ion mass spectrometry depth profiling. A high concentration of bromine end groups at the interface between the polymer and the substrate helped to prevent the dewetting of films. In contrast, the bromine end groups were found to be more evenly distributed in unstable thin films. The extent to which the bromine end groups segregate to the interface depended on the competitive interactions between the polymer, the solvent and the substrate. Stronger polymer-solvent and solvent-substrate interactions prevented the segregation of the bromine end groups to the interface, resulting in unstable polymer films.
机译:使用各种溶剂和基材制备稳定和不稳定的旋涂聚合物薄膜。飞行时间二次离子质谱深度分析揭示了聚合物端基浓度与旋涂聚合物薄膜稳定性之间的关系。在聚合物和基材之间的界面处高浓度的溴端基有助于防止薄膜脱湿。相反,发现溴端基在不稳定的薄膜中分布更均匀。溴端基偏向界面的程度取决于聚合物,溶剂和底物之间的竞争性相互作用。较强的聚合物-溶剂和溶剂-底物相互作用阻止了溴端基偏向界面,导致聚合物膜不稳定。

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