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首页> 外文期刊>Surface and Interface Analysis: SIA: An International Journal Devoted to the Development and Application of Techniques for the Analysis of Surfaces, Interfaces and Thin Films >Summary of ISO/TC 201 Standard: ISO 16129-:2012 - Surface chemical analysis - Procedures to assess the day-to-day performance of an X-ray photoelectron spectrometer
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Summary of ISO/TC 201 Standard: ISO 16129-:2012 - Surface chemical analysis - Procedures to assess the day-to-day performance of an X-ray photoelectron spectrometer

机译:ISO / TC 201标准摘要:ISO 16129-:2012-表面化学分析-评估X射线光电子能谱仪的日常性能的程序

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摘要

This International Standard is designed to allow the user to simply assess, on a routine basis, several key parameters of an X-ray photoelectron spectrometer. It is not intended to provide an exhaustive performance check but instead provides a rapid set of tests that may be conducted frequently. Aspects of instrument behaviour covered by this document include the vacuum, measurements of spectra of conductive or non-conductive samples and the current state of the X-ray source. Other important aspects of the instrument performance (e.g. lateral resolution) fall outside the scope of this standard. The standard is intended for use with commercial X-ray photoelectron spectrometers equipped with a monochromated Al Kα X-ray source or with a unmonochromated Al or Mg Kα X-ray source.
机译:该国际标准旨在使用户能够常规地简单评估X射线光电子能谱仪的几个关键参数。它并非旨在提供详尽的性能检查,而是提供一组可能经常执行的快速测试。本文档涵盖的仪器性能方面包括真空,导电或不导电样品的光谱测量以及X射线源的当前状态。仪器性能的其他重要方面(例如横向分辨率)不在本标准范围之内。该标准旨在与配备有单色AlKαX射线源或未单色Al或MgKαX射线源的商业X射线光电子能谱仪一起使用。

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