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首页> 外文期刊>The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical >Nanoscale Photocurrent Variations at Metal-Modified Semiconductor Surfaces
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Nanoscale Photocurrent Variations at Metal-Modified Semiconductor Surfaces

机译:金属修饰的半导体表面的纳米级光电流变化

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The photocurrents measured by a scanning tunneling microscope have been used to analyze the electronic properties of nanoscale-modified WSe↓(2) semiconductor surfaces. On uncovered crystals in ambient air, space charges along steps can be analyzed. On copper-modified semiconductor surfaces, the space charge zones around pulse-deposited metal particles and their dependence on the size of the metal particle can be determined and provide a first direct proof of size-dependent barrier heights of nanosized Schottky contacts. Also, the time evolution of the electronic properties of a metal-modified WSe↓(2) surface under corrosion conditions was followed by photocurrent measurements. By combination of photocurrent measurements and local current/ voltage curves, the influence of recombination and of charges on the photocurrent can be separated.
机译:通过扫描隧道显微镜测量的光电流已用于分析纳米级修饰的WSe↓(2)半导体表面的电子性能。在环境空气中未发现的晶体上,可以分析台阶上的空间电荷。在铜改性的半导体表面上,可以确定脉冲沉积金属颗粒周围的空间电荷区及其对金属颗粒尺寸的依赖性,并提供纳米尺寸肖特基接触的尺寸依赖性势垒高度的第一个直接证明。同样,在腐蚀条件下,对金属改性的WSe↓(2)表面的电子性能进行时间​​演化,然后进行光电流测量。通过结合光电流测量值和局部电流/电压曲线,可以分离重组和电荷对光电流的影响。

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