首页> 外文期刊>Chemistry of Materials: A Publication of the American Chemistry Society >Structural Dependence of Microwave Dielectric Properties of SrRAlO4 (R = Sm, Nd, La) Ceramics: Crystal Structure Refinement and Infrared Reflectivity Study
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Structural Dependence of Microwave Dielectric Properties of SrRAlO4 (R = Sm, Nd, La) Ceramics: Crystal Structure Refinement and Infrared Reflectivity Study

机译:SrRAlO4(R = Sm,Nd,La)陶瓷的微波介电性能的结构依赖性:晶体结构细化和红外反射率研究

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摘要

The crystal structure refinement and infrared reflectivity study were carried out for SrRAlO4 (R = Sm, Nd, La) ceramics with K2NiF4 structure to investigate the correlations between the crystal structure, polar-phonon mode parameters, and microwave dielectric properties. Fourier transform infrared reflectivity spectra in the range of 50—4000 cm~(-1) were measured and evaluated by means of classical oscillator fit. The data were extrapolated below the measured frequency range to estimate the intrinsic microwave losses. Heavy distortions of (Sr,R)O9 dodecahedra and AlO6 octahedra are observed in the crystal structure and they should attribute to interlayer electric polarization and interlayer size mismatch. The two lowest-frequency polar-phonon modes, which give primary contributions to the microwave complex permittivity, are the bending and stretching vibrations of (Sr,R)-AlO6, so that the distortion of (Sr,R)O9 dodecahedra has a great impact on the dispersion parameters of these two modes and consequently affects polarizabilities and intrinsic dielectric losses of SrRAlO4 greatly. The above findings provide the general guideline for modifying the intrinsic microwave dielectric properties for SrRAlO4 ceramics. Moreover, the calculated Q x f values are 25 000—85 000 GHz higher than the measured ones, and this suggests the great opportunity to improve Q x f through optimizing the microstructures.
机译:对具有K2NiF4结构的SrRAlO4(R = Sm,Nd,La)陶瓷进行了晶体结构细化和红外反射率研究,以研究晶体结构,极性声子模式参数与微波介电性能之间的相关性。利用经典的振荡器拟合对50-4000 cm〜(-1)范围内的傅立叶变换红外反射光谱进行了测量和评估。在测得的频率范围以下外推数据,以估算固有微波损耗。在晶体结构中观察到(Sr,R)O9十二面体和AlO6八面体的严重畸变,它们应归因于层间电极化和层间尺寸失配。 (Sr,R)-AlO6的弯曲和拉伸振动是影响微波复介电常数的两个最低频率的极化声子模式,因此(Sr,R)O9十二面体的畸变很大影响这两种模式的色散参数,因此极大地影响了SrRAlO4的极化率和固有介电损耗。以上发现为改变SrRAlO4陶瓷的固有微波介电性能提供了一般指导。此外,计算出的Q x f值比测量值高25 000–85 000 GHz,这表明通过优化微观结构来改善Q x f的巨大机会。

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