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首页> 外文期刊>The Journal of Chemical Physics >SECONDARY ION MASS SPECTROMETRY WITHOUT SECONDARY ION EMISSION - RECOMBINATIVE SCATTERING OF HYPERTHERMAL CS+ IONS FROM A SI(111) SURFACE ADSORBED WITH WATER
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SECONDARY ION MASS SPECTROMETRY WITHOUT SECONDARY ION EMISSION - RECOMBINATIVE SCATTERING OF HYPERTHERMAL CS+ IONS FROM A SI(111) SURFACE ADSORBED WITH WATER

机译:无需二次离子发射的二次离子质谱法-吸附了水的SI(111)表面的高热CS +离子的复合散射

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摘要

Collision of hyperthermal Cs+ ion beams with a Si(111) surface partially covered with water gives rise to emission of CsX(+) cluster ions (X is a surface-atom or molecule) even when the monomer X(+) ions are not produced. The yield for atomic and cluster ion emission is examined as a function of Cs+ collision energy, based on which, we propose that CsX(+) species are formed by recombination of the scattered, low kinetic energy Cs+ ions and the gaseous neutral species emanating from a surface. It is also demonstrated that under this condition the secondary neutral flux contains a large fraction of molecular units. (C) 1995 American Institute of Physics. [References: 28]
机译:即使没有产生单体X(+)离子,高温的Cs +离子束与Si(111)表面部分被水碰撞也会导致CsX(+)簇离子(X是表面原子或分子)的发射。 。根据Cs +碰撞能量的函数检查了原子和簇离子发射的产率,在此基础上,我们提出CsX(+)物种是由散射的,低动能Cs +离子与由Cs +碰撞产生的气态中性物种重组形成的表面。还证明了在这种条件下,次级中性通量包含很大一部分分子单元。 (C)1995年美国物理研究所。 [参考:28]

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