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Investigation of self-assembled fractal porous-silica over a wide range of length scales using a combined small-angle scattering method

机译:使用组合小角度散射方法研究各种长度尺度上的自组装分形多孔二氧化硅

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摘要

The unique structure of a set of self-assembled porous silica materials was characterized through a combined small-angle scattering (CSAS) method using small- and ultra-small angle neutron scattering as well as small-angle X-ray scattering. The porous silica specimens investigated were prepared by a sol-gel method under the presence of alkylketene dimer (AKD) template particles and through calcination, which leads to the development of porous silica having a mass-fractal structure over length scales from similar to 100 nm to similar to 10 mu m. Furthermore, the specimens posses a hierarchical structure, which consist of a fractal porous structure, and also contain primary silica particles less than 10 nm in size, which form a continuous silica matrix. To characterize these complex structures, observation over a broad range of length scales is indispensable. We propose a CSAS technique that serves this purpose well.
机译:通过使用小角和超小角中子散射以及小角X射线散射的组合小角散射(CSAS)方法,对一组自组装多孔二氧化硅材料的独特结构进行了表征。在烷基乙烯酮二聚体(AKD)模板颗粒存在下,通过溶胶-凝胶法制备了多孔二氧化硅样品,并通过煅烧制备了多孔二氧化硅样品,从而开发了质量分数结构的多孔二氧化硅,其长度范围从大约100 nm大约10微米此外,样品具有分级结构,其由分形多孔结构组成,并且还包含尺寸小于10nm的初级二氧化硅颗粒,其形成连续的二氧化硅基质。为了表征这些复杂的结构,在广泛的长度范围内进行观察是必不可少的。我们提出了一种可以很好地满足此目的的CSAS技术。

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