Imaging of spontaneous emission from 980 nm tapered lasers with windowed N-contacts

摘要

Experimental measurements of the spatial distribution of the spontaneous emission produced inside the cavity of a 4degrees 980 nm tapered laser are presented and compared with the results of a 2.5 D half-space, hot-cavity simulation. A custom device with a windowed n-contact was designed and fabricated for this work. The effectiveness of this windowed contact was investigated and appears to be satisfactory. The measurement system for photo- and electroluminescence microscopy imaging was quantitatively calibrated with an error of <&PLUSMN;15%. Good agreement between the experimental and simulated results are presented, with an error of &SIM;6% in the carrier density at the output facet.