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首页> 外文期刊>Technisches Messen: Sensoren, Gerate, Systeme >Investigations of the Measurement of Micro Geometries with Large Tactile CMMs and Application at a Micro-CT Artefact
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Investigations of the Measurement of Micro Geometries with Large Tactile CMMs and Application at a Micro-CT Artefact

机译:大型触觉坐标测量机测量微几何的研究及其在微CT伪像上的应用

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摘要

Investigations are described to measure micro-geometries by means of a large tactile coordinate measuring machine (CMM). The influence of the contacting force is investigated experimentally and the influence of form deviations on the measurement uncertainty is determined. At the example of a standard for micro computed tomography ((mu)CT) the measurement results of different tactile CMMs and a (mu)CT are compared.
机译:描述了通过大型触觉坐标测量机(CMM)测量微几何的研究。实验研究了接触力的影响,并确定了形状偏差对测量不确定度的影响。在用于微型计算机断层摄影术(μCT)的标准示例中,比较了不同触觉CMM和μCT的测量结果。

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