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Calibration parameters for the probing tip of a magnetic force microscope in the field of a test current loop

机译:在测试电流回路领域中的磁力显微镜探测头的校准参数

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摘要

The subject of discussion is calibration of the tip of a magnetic force microscope using the field of a ring-shaped current loop. To calculate the calibration parameters, the magnetic contribution from the extended tip of the probe in the field of the current loop to the rigidity of the cantilever is approximated by the contribution from a point magnetic dipole and magnetic "charge" in terms of the theoretical model adopted. Three simplified models of the conic tip (with a sharpened, blunted, and rounded top) are considered. The calculated dependences of the effective calibration parameters on the radius of the current loop are compared with experimental data. It is found that the model of a uniformly magnetized tip in the form of a blunted cone provides the best fit to the experiment. The calculation results may be helpful in simulating images obtained with a magnetic force microscope and numerically testing magnetic objects.
机译:讨论的主题是使用环形电流环的磁场对磁力显微镜的尖端进行校准。为了计算校准参数,根据理论模型,通过点磁偶极子和磁性“电荷”的贡献,可以估算出在电流环路区域中从探针的延伸尖端到悬臂的刚度的磁性贡献。通过。考虑了圆锥形尖端的三种简化模型(具有尖锐的,钝的和圆形的顶部)。将有效校准参数对电流环路半径的计算依赖性与实验数据进行比较。发现以钝头锥形形式的均匀磁化尖端的模型最适合该实验。计算结果可能有助于模拟用磁力显微镜获得的图像以及对磁性物体进行数值测试。

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