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An ultrasonic methodology for determining the mechanical and geometrical properties of a thin layer using a deconvolution technique

机译:使用反卷积技术确定薄层的机械和几何特性的超声方法

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摘要

An ultrasonic method is proposed for simultaneously determining the thickness, density, sound velocity, and attenuation of a thin layer from a reflection spectrum at normal incidence. The normal theoretical reflection spectrum of a thin layer is established as a function of three dimensionless parameters to reduce the number of independent parameters. The inverse algorithm, using the least squares method, is adopted to determine the dimensionless parameters, and the corresponding convergence zones are investigated. The measured reflection spectrum at normal incidence is obtained using Wiener filtering, and spectral extrapolations following Wiener filtering are applied to obtain the time-of-flights by identifying the overlapping pulse-echoes inside the thin layer and the superposing pulse-echoes from the reference material and front surface of the specimen. The thickness of the thin layer can then be calculated and as initial estimate for the inverse algorithm. The density, sound velocity, and attenuation are then determined by the measured thin layer thickness and determined dimensionless parameters. Two 500 μm stainless steel and aluminum plates were immersed in coupling water and a 5 MHz flat transducer was applied. The relative errors of measured thickness, density, and sound velocity were less than 6%, and the ultrasound attenuation was close to its true value. The validity of the proposed technique was verified.
机译:提出了一种超声波法,用于同时根据法线入射的反射光谱确定薄层的厚度,密度,声速和衰减。建立薄层的正常理论反射光谱是三个无量纲参数的函数,以减少独立参数的数量。采用最小二乘法的逆算法确定无量纲参数,并研究了相应的收敛区域。使用维纳滤波获得在垂直入射时测得的反射光谱,并且通过识别薄层内部的重叠脉冲回波和参考材料中的重叠脉冲回波,在维纳滤波之后进行光谱外推,以获取飞行时间。和样品的前表面。然后可以计算薄层的厚度,并将其作为逆算法的初始估计。然后,由测量的薄层厚度和确定的无量纲参数确定密度,声速和衰减。将两个500μm不锈钢和铝板浸入耦合水中,并施加5 MHz平面传感器。测得的厚度,密度和声速的相对误差小于6%,超声衰减接近其真实值。验证了所提技术的有效性。

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