首页> 外文期刊>Progress in photovoltaics >Re-investigation of preferential orientation of Cu(In,Ga)Se_2 thin films grown by the three-stage process
【24h】

Re-investigation of preferential orientation of Cu(In,Ga)Se_2 thin films grown by the three-stage process

机译:三步法生长的Cu(In,Ga)Se_2薄膜优先取向的再研究

获取原文
获取原文并翻译 | 示例
           

摘要

The present contribution deals with the rather longstanding issue of the preferential orientation of Cu(In,Ga)Se_2 polycrystalline thin films. We investigate both the influence of the growth process parameters and that of the presence of Na on the competition between [112] and [220] orientations. The influence of the presence of Na is studied through the comparison of CIGSe layers co-evaporated on our laboratory standard Mo-coated soda lime glass (SLG/Mo) and on substrates with a sodium diffusion barrier (SLG/barrier/Mo); the process dependence of the orientation is evaluated through the comparison of films grown by the standard bithermal three-stage (400–630℃) and the derived isothermal three-stage process (620℃). For all the process/substrate combinations, the properties of the films (preferential orientation, grain size and morphology) have been determined at key steps of the growth. From these experimental results, it can be concluded that, as already suggested in the literature, the final layer orientation is strongly related to the texturation of the (In,Ga)_2Se_3 precursor; however, the amount of Na available when the film becomes Cu-rich (recrystallization at the end of the 2ndstage) can also strongly impact the film orientation. Such a phenomenon is herein interpreted by mean of the grain boundary migration model of recrystallization. In agreement with this new interpretation of the experimental data, processes have been designed in order to grow [220] textured CIGSe layers.
机译:本贡献涉及Cu(In,Ga)Se_2多晶薄膜的优先取向的长期存在的问题。我们研究了生长过程参数和Na的存在对[112]和[220]取向之间竞争的影响。通过比较在我们实验室标准涂钼的钠钙玻璃(SLG / Mo)和具有钠扩散阻挡层(SLG / barrier / Mo)的基底上共蒸发的CIGSe层,研究了Na的影响。通过比较标准双热三阶段(400–630℃)和衍生的等温三阶段过程(620℃)生长的薄膜,可以评估取向的工艺依赖性。对于所有工艺/基材组合,已经在生长的关键步骤确定了薄膜的性能(优先取向,晶粒尺寸和形态)。从这些实验结果可以得出结论,如文献中已经暗示的,最终的层取向与(In,Ga)_2Se_3前体的组织紧密相关。但是,当膜变得富含铜时(第二阶段结束时的重结晶),可用的Na量也会强烈影响膜的取向。这种现象在此借助于再结晶的晶界迁移模型来解释。与对实验数据的这种新解释相一致,已经设计了过程以生长[220]纹理CIGSe层。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号