Sunlight is transformed into electric energy by means of solar cells. The standard material of which to manufacture solar cells currently is multicrystalline silicon, which is obtained by different casting methods. Characterizing the silicon wafers is of great significance. Grain sizes, when determined, and the number of dislocations existing within the wafer allow to draw conclusions on the subsequent efficiency of a solar cell. This article is mainly aimed at developing a rapid preparation technique for multicrystalline silicon wafers. As a result the preparation technique guarantees reproducibility and ensures a non-deformed sample surface combined with high planarity. These are indispensable features for automated quality control.
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