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Calibration of linear encoders with sub-nanometer uncertainty using an optical-zooming laser interferometer

机译:使用光学变焦激光干涉仪校准亚纳米不确定度的线性编码器

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The nonlinear errors of high-precision linear encoders were calibrated by using a nanometer-length calibrator that was based on the optical-zooming laser interferometer with an optical frequency comb. A transmission-type linear encoder and a reflection-type linear encoder were calibrated, and the cyclic nonlinear errors were evident. The magnitudes of the observed cyclic errors were 0.1 nm and 0.2 nm, respectively, and the best calibration uncertainties were 0.55 nm (k = 2). A traceable calibration service for linear encoders with the best calibration uncertainty in the sub-nanometer range has started based on this work.
机译:高精度线性编码器的非线性误差是通过使用纳米长度的校准器来校准的,该校准器基于具有光学频率梳的光学变焦激光干涉仪。对透射型线性编码器和反射型线性编码器进行了校准,并且明显存在周期性非线性误差。观察到的循环误差的大小分别为0.1 nm和0.2 nm,最佳校准不确定度为0.55 nm(k = 2)。基于这项工作,已开始为具有亚纳米范围内最佳校准不确定性的线性编码器提供可追溯的校准服务。

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