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Pulse plating of gold-tin alloys for microelectronic & optoelectronic applications

机译:微电子和光电应用的金锡合金的脉冲镀

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Gold-tin eutectic solders (30 at% Sn) are used for packaging microelectronic and optoelectronic devices, because of their excellent thermal and mechanical properties and relatively low melting or reflow temperature (280℃; 536°F). Electroplating is a cost effective alternative to current commercial solder deposition processes, such as solder preforms and evaporation. A simultaneous electroplating process for depositing Au-Sn alloys, from a slightly acidic, chloride-based solution using pulsed currents, onto metallized ceramic and semiconductor substrates has been developed. Two separate Au-Sn compositions, containing 15 at% Sn and 50 at% Sn, can be deposited under appropriate plating conditions, i.e., current density, pulse on-off time and pulse duration. These compositions, according to the Au-Sn phase diagram, correspond to Au{sub}5Sn and AuSn, respectively. By using multiple current pulses and varying their duration, it is possible to deposit a composite solder structure with an overall composition ranging from 15 to 50 at% Sn, including the important eutectic composition. Plating results for both unpatterned and patterned (with photoresist) substrates are presented. All substrates were metallized with Ti-Au or Ti-Mo-Au, to provide a gold seed layer for electroplating.
机译:金锡共晶焊料(锡含量为30 at%)用于包装微电子和光电子器件,因为它们具有出色的热和机械性能以及较低的熔化或回流温度(280℃; 536°F)。电镀是当前商业焊料沉积工艺(例如焊料预成型坯和蒸发)的一种经济有效的替代方法。已经开发了一种同时电镀工艺,用于使用脉冲电流从弱酸性的氯化物基溶液中将Au-Sn合金沉积到金属化陶瓷和半导体衬底上。可以在适当的电镀条件下,即电流密度,脉冲通断时间和脉冲持续时间,沉积两种分别含有15at%Sn和50at%Sn的Au-Sn组合物。根据Au-Sn相图,这些组成分别对应于Au {sub} 5Sn和AuSn。通过使用多个电流脉冲并改变其持续时间,有可能沉积一种复合焊料结构,其总组成范围为15至50 at%Sn,包括重要的共晶组成。给出了未图案化和已图案化(使用光刻胶)基板的电镀结果。所有基板均用Ti-Au或Ti-Mo-Au进行金属化,以提供用于电镀的金籽晶层。

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