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Atomic Force Microscopy:Applications in the Plastics Industry

机译:原子力显微镜:在塑料工业中的应用

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The relatively recent invention of atomic force microscopy(AFM)in the early 1980s has proven to be a boon for the characterization of polymers in the plastics industry.Polymer surface morphology can be characterized at high magnification and resolution by AFM,which is an excellent complimentary technique to the electron microscopy(EM)techniques,such as scanning electron(SEM)and transmission electron microscopy(TEM).AFM has rapidly increased in applications to polymer characterization and has distinguished itself as a primary technique for such characterization.AFM has been especially effective in the characterization of all types of fabricated polymer articles,such as films,injection and blow moldings,and so on and has proven especially effective for characterizing multiphase polymer systems.One aspect of the AFM technique,in comparison to the electron microscopies,is the ease of sample preparation.AFM requires little or no sample preparation and preserves sample structure,whereas SEM and TEM,typically,require much more sample preparation,which often destroys or modifies sample structure in the process.AFM has the attribute of directness of observation and,therefore,reveals structural features of natural surfaces or cross-sections of fabricated polymer articles,which are often difficult to observe by the electron microscopies,due to the necessity of more extensive sample preparation.The AFM technique also has the advantage of independently providing information both on the in-plane,as well as the height,features of a surface.This article describes aspects of the AFM technique relative to basic principles,sample preparation,morphology of polymers,comparison to the EM techniques and characterization of fabricated plastics.
机译:原子力显微镜(AFM)是1980年代初期相对较新的发明,被证明是塑料工业中表征聚合物的福音.AFM可以以高放大倍数和分辨率表征聚合物表面形态,这是一个很好的补充电子显微镜(EM)技术的主要技术,例如扫描电子(SEM)和透射电子显微镜(TEM)。AFM在聚合物表征中的应用迅速增长,并已成为表征此类聚合物的主要技术。有效地表征所有类型的已加工聚合物制品,例如薄膜,注塑和吹塑等,并且已证明对表征多相聚合物体系特别有效。与电子显微技术相比,AFM技术的一个方面是易于制备样品。AFM几乎不需要或不需要样品制备,并保留了样品结构,而SEM和TEM通常需要更多的样品前处理,这经常会破坏或改变样品的结构。AFM具有观察直接性的属性,因此,它揭示了聚合物制成品的自然表面或横截面的结构特征,由于必须进行更广泛的样品制备,通常很难用电子显微镜观察到。AFM技术还具有可以在平面内以及表面的高度,特征上独立提供信息的优点。本文介绍了AFM技术的一些方面,包括基本原理,样品制备,聚合物的形态,与EM技术的比较以及制成的塑料的特性。

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