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Electroless Plating of Copper on Fluoridated Polyimide Films Modified by Surface Graft Copolymerization With 1-Vinylimidazole and 4-Vinylpyridine

机译:通过1-Vinylimidazole和4-Vinylpyridine的表面接枝共聚改性的氟化聚酰亚胺膜上的化学镀铜

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摘要

Electroless plating of copper via a tin-free activation process was carried out effectively on two types of fluorinated polyimide(FPI)films modified by UV-induced surface graft Copolymerization with N-containing monomers,such as 1-vinylimida-zole(VIDz)and 4-vinyl pyridine(4VP).The graft Copolymerization of VIDz and 4VP was carried out on the argon(Ar)plasma-pretreated FPI films via a solvent-free process under atmospheric conditions.X-ray photoelectron spectroscopy(XPS)results showed that the VIDz graft-copolymerized FPI surface(the VIDz-g-FPI surface)and 4VP graft-copolymerized FPI surface(the 4VP-g-FPI surface)were much more susceptible to the electroless deposition of metals via the Sn-free process than the pristine FPI surfaces,and the FPI surfaces modified by Ar plasma pretreatment alone.T-peel adhesion strengths above 9 N/cm were achieved for the electrolessly deposited copper on both VIDz-g-FPI surfaces(the Cu/VIDz-g-FPI assemblies)and 4VP-g-FPI surfaces(the Cu/4VP-g-FPI assemblies).These adhesion strength values were much higher than those obtained for assemblies involving electrolessly deposited copper on pristine or on Ar plasma pretreated FPI films.The high adhesion strength of the Cu/VIDz-g-FPI and Cu/4VP-g-FPI assemblies was attributed to the synergistic effect of spatial interactions of the grafted VIDz or 4VP polymer chains with the copper atoms,and the fact that the VIDz or 4VP polymer chains were covalently tethered on the FPI surfaces.XPS results also revealed that the Cu/VIDz-g-FPI and Cu/4VP-g-FPI assemblies delaminated by cohesive failure inside the FPI films.
机译:在两种类型的氟化聚酰亚胺(FPI)膜上进行了无锡活化过程,化学镀铜是有效的,该膜经过紫外线诱导的表面接枝共聚与含氮单体(例如1-乙烯基咪唑(VIDz)和4-乙烯基吡啶(4VP).VIDz和4VP的接枝共聚反应是在大气条件下通过无溶剂工艺在氩(Ar)等离子预处理的FPI薄膜上进行的.X射线光电子能谱(XPS)结果表明: VIDz接枝共聚FPI表面(VIDz-g-FPI表面)和4VP接枝共聚FPI表面(4VP-g-FPI表面)比无锡工艺更容易受到金属的化学沉积的影响。原始FPI表面,以及仅通过Ar等离子体预处理改性的FPI表面。在两个VIDz-g-FPI表面(Cu / VIDz-g-FPI组件)上化学沉积的铜,T剥离粘合强度均达到9 N / cm以上)和4VP-g-FPI表面(Cu / 4VP-g-FPI组件这些附着强度值远高于在原始或Ar等离子预处理的FPI膜上化学镀铜的组件所获得的附着强度值.Cu / VIDz-g-FPI和Cu / 4VP-g-FPI的高附着强度组装归因于接枝的VIDz或4VP聚合物链与铜原子的空间相互作用的协同效应,以及VIDz或4VP聚合物链被共价束缚在FPI表面的事实。XPS结果还表明Cu / VIDz -g-FPI和Cu / 4VP-g-FPI组件因FPI膜内部的内聚破坏而分层。

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