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Effect of the ion impact on the structure of boron nitride films prepared by plasma enhanced chemical vapour deposition

机译:离子对等离子体增强化学气相沉积法制备氮化硼薄膜结构的影响

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Boron nitride films have been deposited by a plasma enhanced chemical vapour deposition (PECVD) method from a mixture of BF3 and NH3 gases. The hexagonal phase of boron nitride was generated when no self-bias was applied to the substrate. The volume fraction of the hexagonal phase of the boron nitride film decreased as the negative serf-bias of the substrate electrode increased. Ions, such as BF2+, accelerated by the negative self-bias to the substrate are thought to break down the hexagonal phase. Ion impact on the growth surface also had the effect of inactivating the films by removing weakly bonded atoms. [References: 11]
机译:氮化硼膜已经通过等离子体增强化学气相沉积(PECVD)方法从BF3和NH3气体的混合物中沉积。当没有自偏压施加到衬底上时,生成氮化硼的六方相。氮化硼膜的六方相的体积分率随着基板电极的负自偏压而增加。通过负自偏压加速到衬底的离子(如BF2 +)被认为会破坏六方相。通过去除弱键合的原子,离子对生长表面的影响还具有使薄膜失活的作用。 [参考:11]

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