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Application of polarization interferometers for Thomson scattering

机译:偏振干涉仪在汤姆逊散射中的应用

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摘要

Wide field-of-view, high transparency birefringent filters ( essentially fixed delay interferometers) are proposed for incoherent Thomson scattering measurements of the temperature and density of plasma free electrons. For thermal electrons, the optical coherence of the Thomson scattered light at an appropriately chosen optical path delay, is a unique function of the electron temperature and density. The detection system utilizes a single filter combined with imaging optics and dual detector arrays to simultaneously observe both dark and bright scattered light interference fringes. The system delivers two signals that allow the recovery of the two unknowns-temperature and density. It is shown that the normalized intensity difference between the bright and dark interference fringes gives a direct measure of the electron temperature, even for strongly blue shifted high temperature spectra. As usual, the total scattered light flux ( the sum of bright and dark signals) is proportional to the number of illuminated electrons. For multi-pulse systems, an electronically switchable ferroelectric liquid crystal delay plate synchronized with the laser repetition rate can allow density and temperature to be obtained using a single detector array. The use of a time-multiplex approach both simplifies relative channel calibration issues and opens the possibility for 2D temperature imaging. This paper describes the measurement principle and presents the results of numerical simulations for both low and high temperature scenarios.
机译:提出了用于非等离子体汤姆逊散射测量等离子自由电子的温度和密度的宽视场,高透明双折射滤光片(本质上是固定延迟干涉仪)。对于热电子,在适当选择的光程延迟下,汤姆森散射光的光学相干性是电子温度和密度的唯一函数。该检测系统利用结合了成像光学元件和双重检测器阵列的单个滤光片,同时观察暗和亮散射光的干涉条纹。该系统提供两个信号,可以恢复两个未知数-温度和密度。结果表明,即使对于强烈蓝移的高温光谱,亮和暗干涉条纹之间的归一化强度差也可以直接测量电子温度。像往常一样,总的散射光通量(明暗信号的总和)与被照射电子的数量成正比。对于多脉冲系统,与激光重复频率同步的电子可切换的铁电液晶延迟板可允许使用单个检测器阵列获得密度和温度。时分复用方法的使用既简化了相对通道校准问题,又为2D温度成像开辟了可能性。本文描述了测量原理,并给出了在低温和高温情况下的数值模拟结果。

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