首页> 外国专利> POLARIZATION SPLITTING SECTION OF POLARIZATION-SPLIT INTERFEROMETER, THE POLARIZATION-SPLIT INTERFEROMETER, AND POLARIZATION-SPLIT INTERFEROMETER TYPE LENGTH MEASURING DEVICE

POLARIZATION SPLITTING SECTION OF POLARIZATION-SPLIT INTERFEROMETER, THE POLARIZATION-SPLIT INTERFEROMETER, AND POLARIZATION-SPLIT INTERFEROMETER TYPE LENGTH MEASURING DEVICE

机译:极化分离干涉仪的极化分离部分,极化分离干涉仪和极化分离干涉仪类型的长度测量装置

摘要

PROBLEM TO BE SOLVED: To reduce cost, and simplify adjustment by reducing the optical components of a polarization-split interferometer.;SOLUTION: In the polarization-split interferometer which branches light emitted from a light source 102 into measuring light and reference light, performs polarization splitting of light acquired by reflecting the measuring light with a reflection mirror and the reference light by a first polarization beam splitter 105 and makes them interfere; a second polarization beam splitter 106 for performing polarization splitting of transmitted light of the measuring light and reflected light of the reference light, is arranged with its reflection surface directed to a direction to be indicated when rotated by 45 degrees around an incident light axis from a reference position; a third polarization beam splitter 107 for performing polarization splitting of the reflected light of the measuring light and transmitted light of the reference light, is arranged with its reflection surface directed to a direction to be indicated when rotated by 45 degrees around its incident light axis from a reference position; and the outputs of the second and third polarization beam splitters, each of which is interference light between the measuring light and the reference light, are optically detected.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:为了减少成本,并通过减少偏振分离干涉仪的光学组件来简化调整;解决方案:在偏振分离干涉仪中,将从光源102发射的光分成测量光和参考光。通过第一偏振分束器105用反射镜反射测量光和参考光而获得的光的偏振分离,并使它们干涉。用于对测量光的透射光和参考光的反射光进行偏振分离的第二偏振分束器106,其反射面相对于入射光轴绕入射光轴旋转45度时指向要指示的方向。参考位置;第三偏振分束器107用于对测量光的反射光和参考光的透射光进行偏振分光,其反射面相对于入射光轴绕入射光轴旋转45度时指向要指示的方向。参考位置;光学检测第二偏振分束器和第三偏振分束器的输出,每个偏振分束器都是测量光和参考光之间的干涉光。版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010151572A

    专利类型

  • 公开/公告日2010-07-08

    原文格式PDF

  • 申请/专利权人 OJIMA SHISAKU KENKYUSHO:KK;

    申请/专利号JP20080329047

  • 发明设计人 MACHIDA SUSUMU;HIRANO KEIICHI;

    申请日2008-12-25

  • 分类号G01B9/02;G01B11;

  • 国家 JP

  • 入库时间 2022-08-21 19:02:39

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