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Effect of weak magnetic fields on the dynamics of variation in the microhardness of silicon under low-intensity beta irradiation

机译:低强度β辐照下弱磁场对硅显微硬度变化动力学的影响

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摘要

Weak magnetic fields with an induction B = 0.28 T are found to have an effect on the transformation of subsystems of structural ( intrinsic and radiation- induced) silicon defects under irradiation with a low- intensity flux of beta particles (I = 10(5) cm(-2) s(-1)). The effect of a weak magnetic field leads to an increase in fluences at which the disordering exhibits maxima.
机译:发现在感应强度为β的低强度通量辐射下,感应强度B = 0.28 T的弱磁场会影响结构性(固有和辐射诱导的)硅缺陷子系统的转变(I = 10(5) cm(-2)s(-1))。弱磁场的影响会导致无序显示最大值的注量增加。

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