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A COTS-Based Novel 3-D DRAM Memory Cube Architecture for Space Applications

机译:用于空间应用的基于COTS的新型3-D DRAM内存立方体架构

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The first mainstream products in three-dimensional integrated circuit (3-D IC) design are memory devices where multiple memory tiers are horizontally integrated to offer manifold improvements when compared with their 2-D counterparts. Unfortunately, none of these existing 3-D memory cubes are ready for harsh space environments. This article introduces a new memory cube architecture for space, based on the vertical integration of multiple commercial-off-the-shelf, 3-D stacked, dynamic random-access memory (DRAM) memory devices with a custom radiation-hardened-by-design controller. Our solution offers high memory capacity, increased bandwidth, fault tolerance, and improved size-weight-and-power characteristics needed for space missions. Validation and functional evaluation of the application-specific integrated circuit (ASIC) controller will be conducted prior to tape-out on a custom FPGA-based emulator platform integrating the 3-D stack. The selected test methodology ensures high-quality register transfer level (RTL) as well as allows to subject the cube structure to radiation testing. The proposed design concept allows for flexibility in the choice of the DRAM die in the case of technology road-map changes or unsatisfactory radiation results.
机译:三维集成电路(3-D IC)设计中的第一主流产品是存储器设备,其中多个存储器层水平集成,以提供与其2-D对应物相比的歧管改进。不幸的是,这些现有的3-D内存多维数据集中都没有准备好用于恶劣空间环境。本文介绍了一个新的内存多维数据集体系结构,用于空间,基于多个商业现货,3-D堆叠,动态随机存取存储器(DRAM)内存设备的垂直集成,具有定制辐射 - 硬化 - 逐个 - 设计控制器。我们的解决方案提供了高存储器容量,增加带宽,容错以及空间任务所需的尺寸重量和功率特性。在基于自定义FPGA的仿真器平台上集成3-D堆叠的基于自定义FPGA的仿真器平台之前,将在磁带出来之前进行应用专用集成电路(ASIC)控制器的验证和功能评估。所选的测试方法确保了高质量的寄存器传输水平(RTL),也可以使立方体结构进行辐射测试。所提出的设计理念允许在技术道路地图变化或不令人满意的辐射结果的情况下选择DRAM模具的灵活性。

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