Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we have derived both generic (cone-independent) and circuit-specific (cone-dependent) bounds on the minimal length of a test required so that each cone in a circuit is exhaustively tested. For any circuit with five or fewer outputs, and where each output has k or fewer inputs, we show that the circuit can always be pseudoexhaustively tested with just 2/sup k/ patterns. We derive a tight upper bound on pseudoexhaustive test length for a given circuit by utilizing the knowledge of the structure of the circuit output cones. Since our circuit-specific bound is sensitive to the ordering of the circuit inputs, we show how the bound can be improved by permuting these inputs.
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机译：伪穷举测试涉及将所有可能的输入模式应用到组合电路的各个输出锥上。根据我们的新代数结果，我们在所需的最小测试长度上得出了通用（与圆锥无关）和特定于电路（与圆锥相关）的界线，以便对电路中的每个圆锥进行详尽的测试。对于任何具有五个或更少输出的电路，并且每个输出具有k个或更少输入的电路，我们表明该电路始终可以仅用2 / sup k /个模式进行伪穷举测试。通过利用电路输出锥结构的知识，我们得出了给定电路的伪穷举测试长度的严格上限。由于我们特定于电路的界限对电路输入的顺序很敏感，因此我们展示了如何通过排列这些输入来改善界限。
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