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Formal-Analysis-Based Trace Computation for Post-Silicon Debug

机译:硅分析后基于形式分析的跟踪计算

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This paper presents a post-silicon debug methodology that provides a means to rewind, or backspace, a chip from a known crash state using a combination of on-chip real-time data collection and off-chip formal analysis methods. A complete debug flow is presented that considers practical considerations such as area, on-chip non-determinism and signal propagation delay. This flow, along with a low-overhead breakpoint circuit, allows for state-accurate breakpointing capabilities without the need to monitor the entire state of the chip. The flow and associated hardware was tested using a hardware prototype, which consists of an OpenRISC processor instrumented with the debug hardware connected to a PC running the formal verification algorithms. Traces hundreds of cycles long were obtained using the methodology presented in this paper.
机译:本文介绍了一种硅后调试方法,该方法结合了片上实时数据收集和片外形式分析方法,为从已知崩溃状态倒退或退回芯片提供了一种方法。提出了一个完整的调试流程,其中考虑了实际考虑因素,例如面积,片上不确定性和信号传播延迟。该流程与低开销的断点电路一起,可提供状态精确的断点功能,而无需监视芯片的整个状态。使用硬件原型对流程和相关的硬件进行了测试,该原型由OpenRISC处理器组成,该处理器装有调试硬件,该调试硬件连接到运行形式验证算法的PC。使用本文介绍的方法可以获得数百个周期的痕迹。

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