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A 6-bit 2.5-GS/s Time-Interleaved Analog-to-Digital Converter Using Resistor-Array Sharing Digital-to-Analog Converter

机译:使用电阻阵列共享数模转换器的6位2.5-GS / s时间交错式模数转换器

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摘要

This paper presents a 6-bit 2.5-GS/s time-interleaved (TI) successive-approximation-register (SAR) analog-to-digital converter (ADC) that uses a resistor-array sharing digital-to-analog converter (RASD). By applying the input folding technique in the input stage and utilizing the flash-assisted TI-SAR ADC with the proposed RASD, the static power dissipation is reduced by 69%. ON-chip and OFF-chip calibration techniques are used to compensate the interchannel error sources. The prototype was fabricated in a 65-nm CMOS process technology. The peak integral nonlinearity and differential nonlinearity are measured as 0.52 and 0.51 LSB, respectively. At 2.5 GS/s, a signal-to-noise and distortion ratio (SNDR) of 18.6/31.9 dB and a spurious-free dynamic range (SFDR) of 23.7/42.1 dBc are measured before and after the calibration at the Nyquist input frequency with 1 input signal, and the figure of merit is 0.27 pJ/conversion-step. This chip consumes 22 mW at 1.2-V supply and occupies 0.27- area.
机译:本文提出了一种6位2.5-GS / s时间交织(TI)逐次逼近寄存器(SAR)模数转换器(ADC),该转换器使用电阻器阵列共享数模转换器(RASD) )。通过在输入级中应用输入折叠技术,并利用具有建议的RASD的闪存辅助TI-SAR ADC,静态功耗可降低69%。片上和片外校准技术用于补偿通道间误差源。该原型采用65纳米CMOS工艺技术制造。峰积分非线性和微分非线性分别测得为0.52和0.51 LSB。在2.5 GS / s的速度下,在Nyquist输入频率进行校准之前和之后,测量的信噪比(SNDR)为18.6 / 31.9 dB,无杂散动态范围(SFDR)为23.7 / 42.1 dBc。输入信号为1时,品质因数为0.27 pJ /转换步长。该芯片在1.2V电源下的功耗为22mW,占地为0.27-。

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