首页> 外文期刊>IEEE transactions on very large scale integration (VLSI) systems >TS Cache: A Fast Cache With Timing-Speculation Mechanism Under Low Supply Voltages
【24h】

TS Cache: A Fast Cache With Timing-Speculation Mechanism Under Low Supply Voltages

机译:TS缓存:具有低电源电压时序控制机制的快速缓存

获取原文
获取原文并翻译 | 示例

摘要

To mitigate the ever-worsening "power wall" problem, more and more applications need to expand their working voltage to the wide-voltage range including the near-threshold region. However, the read delay distribution of the static random access memory (SRAM) cells under the near-threshold voltage shows a more serious long-tail characteristic than that under the nominal voltage due to the process fluctuation. Such degradation of SRAM delay makes the SRAM-based cache a performance bottleneck of systems as well. To avoid unreliable data reading, circuit-level studies use larger/more transistors in a bitcell by sacrificing chip area and the static power of cache arrays. Architectural studies propose the auxiliary error correction or block disabling/remapping methods in fault-tolerant caches, which worsen both the hit latency and energy efficiency due to the complex accessing logic. This article proposes a timing-speculation (TS) cache to boost the cache frequency and improve energy efficiency under low supply voltages. In the TS cache, the voltage differences of bitlines (BLs) are continuously evaluated twice by a sense amplifier (SA), and the access timing error can be detected much earlier than that in prior methods. According to the measurement results from the fabricated chips, the TS L1 cache aggressively increases its frequency to $1.62imes $ and $1.92imes $ compared with the conventional scheme at 0.5- and 0.6-V supply voltages, respectively.
机译:为了减轻日益严重的“电源壁”问题,越来越多的应用需要将其工作电压扩展到包括近阈值区域在内的宽电压范围。然而,由于工艺波动,在接近阈值电压下静态随机存取存储器(SRAM)单元的读取延迟分布显示出比标称电压下更严重的长尾特性。 SRAM延迟的这种降低也使基于SRAM的缓存成为系统的性能瓶颈。为了避免不可靠的数据读取,电路级研究通过牺牲芯片面积和高速缓存阵列的静态功耗来在位单元中使用更大/更多的晶体管。架构研究提出了容错缓存中的辅助错误校正或块禁用/重新映射方法,由于复杂的访问逻辑,这会增加命中延迟和能效。本文提出了一种时序推测(TS)缓存,以提高缓存频率并在低电源电压下提高能效。在TS高速缓存中,位线(BLs)的电压差被读出放大器(SA)连续评估两次,并且访问时序错误的检测时间比现有方法要早得多。根据制造芯片的测量结果,与传统方案在0.5V和0.6V电源电压下相比,TS L1高速缓存将其频率大幅度提高至$ 1.62 times和$ 1.92 times。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号