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首页> 外文期刊>Surface Science >Growth of zinc phthalocyanine onto ZnS film investigated by synchrotron radiation-excited X-ray photoelectron and near-edge absorption spectroscopy
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Growth of zinc phthalocyanine onto ZnS film investigated by synchrotron radiation-excited X-ray photoelectron and near-edge absorption spectroscopy

机译:同步辐射激发的X射线光电子和近边缘吸收光谱研究了酞菁锌在ZnS薄膜上的生长

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摘要

The molecular ordering and orientation of zinc phthalocyanine (ZnPc) on a ZnS film as well as the chemical properties of the interface were investigated by X-ray photoelectron and absorption spectroscopy with synchrotron radiation excitation. Core level photoelectron spectra of the substrate and the ZnPc film indicate a weak interaction at the interface. We observe a high molecular ordering, which is enhanced with increasing film thickness. A standing (or highly-tilted) molecular orientation in about 8 nm-thick ZnPc films is deduced from the polarization dependence of the N K X-ray absorption spectra. The same result was obtained from excitation energy dependence of the intensity ratio of the two carbon species in C 1s core level spectra. The annealing of the sample up to about 400℃ causes a desorption of ZnPc and a stronger interaction between remaining molecules and ZnS.
机译:通过X射线光电子和吸收光谱以及同步加速器辐射激发研究了ZnS薄膜上锌酞菁(ZnPc)的分子有序排列和取向以及界面的化学性质。基板和ZnPc膜的核心能级电子光谱表明界面处的相互作用较弱。我们观察到高分子有序性,随着膜厚的增加而增强。从N K X射线吸收光谱的偏振相关性推论出大约8 nm厚的ZnPc膜中的站立(或高度倾斜)分子取向。从C 1s核心能级谱中两种碳物质的强度比的激发能依赖性获得了相同的结果。样品在最高约400℃的温度下退火会导致ZnPc的解吸以及剩余分子与ZnS之间的较强相互作用。

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