Study for noise reduction in synchrotron radiation based scanning tunneling microscopy by developing insulator-coat tip

摘要

To solve difficulties of instability and inaccuracy in synchrotron radiation based scanning tunneling microscopy, a method to reduce noise was investigated. New insulator-coat tips were developed to shut out electrons coming from a wide area that damage the spatial resolution. By changing the exposed conductive area at the end of the insulator-coat tips, the effect of noise reduction was estimated. The tip with an exposure area of 50 nm in diameter was found to reduce noise effectively. Also a key discriminating condition was found to obtain the local signal, which is based on the modulation of the X-ray-induced tip current caused by excitation of the specific element.