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Electronic structures of Ga-induced incommensurate and commensurate overlayers on the Si(111) surface

机译:Ga在Si(111)表面上诱导的不相称和相称覆盖层的电子结构

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摘要

Electronic band structures of Ga-induced dense overlayers on the Si(111) surface have been investigated using angle-resolved photoelectron spectroscopy and first-principle density-functional theory calculations. The well-known incommensurate 6.3×6.3 phase formed by the growth on the Si(111)7×7 surface and the newly found 1×1 phase grown on the preformed Si( 111)3~(1/2)×3~(1/2)-Ga surface are characterized in detail. A highly dispersive surface state (S) is observed for the incommensurate phase but only a weakly dispersing one (S') for the 1×1 surface. Both surfaces are found to be nonmetallic, with their surface states fully occupied. The theoretical calculation reproduces well the S band of the 6.3 × 6.3 phase on the basis of a simple 1×1 Ga-Si bilayer structure formed with substitutional Ga atoms, which was proposed previously. No explicit sign of the incommensurate periodicity is found in the measured band dispersions, indicating a very weak incommensurate potential. The S band is shown to originate in the sp~2-like planar bonds within the Ga-Si bilayer. The width of the S band is sensitive to the surface strain in the calculation and about 8% expansion of the Ga-Si bilayer lattice was needed to reproduce the measured dispersions, which is in good agreement with the previous X-ray study. On the other hand, the surface state S' of the commensurate 1×1 phase cannot be explained by any simple model of a substitutional or adsorbed Ga layer. Further structural studies are thus requested. The second Ga layer, which is metallic, grows two-dimensionally over this 1×1 layer up to a total coverage of about 5 ML.
机译:利用角度分辨光电子能谱和第一原理密度泛函理论计算研究了Ga诱导的Si(111)表面致密覆盖层的电子能带结构。通过在Si(111)7×7表面上生长而形成的众所周知的不相称的6.3×6.3相和在预先形成的Si(111)3〜(1/2)×3〜(上生长的新发现的1×1相) 1/2)-Ga表面的详细特征。对于不相称的相,观察到高度分散的表面状态(S),而对于1×1的表面,仅观察到弱分散的表面状态(S')。发现两个表面都是非金属的,它们的表面状态被完全占据。理论计算基于先前提出的由取代的Ga原子形成的简单1×1 Ga-Si双层结构,很好地再现了6.3×6.3相的S带。在测得的频带色散中未发现明显不规则的周期性迹象,表明非常微弱的不规则电位。 S带显示出起源于Ga-Si双层内的sp_2样平面键。 S带的宽度在计算中对表面应变敏感,并且需要大约8%的Ga-Si双层晶格扩展来重现所测得的色散,这与先前的X射线研究非常吻合。另一方面,不能通过取代或吸附的Ga层的任何简单模型来解释相称的1×1相的表面状态S'。因此需要进一步的结构研究。金属的第二Ga层在此1×1层上二维生长,总覆盖率约为5 ML。

著录项

  • 来源
    《Surface Science》 |2011年第2期|p.146-152|共7页
  • 作者单位

    Center for Atomic Wires and Layers and Department of Physics, POSTECH, Pohang, 790-784, Republic of Korea;

    rnCenter for Atomic Wires and Layers and Department of Physics, POSTECH, Pohang, 790-784, Republic of Korea Korea Research Institute for Standards and Science, Daejeon 305-340, Korea;

    rnCenter for Atomic Wires and Layers and Department of Physics, POSTECH, Pohang, 790-784, Republic of Korea Department of Physics, SungKyunKwan University, Suwon 440-746, Republic of Korea;

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  • 正文语种 eng
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  • 关键词

    gallium; silicon; angle-resolved photoemission; surface electronic phenomena; metal-Semiconductor interface;

    机译:镓;硅;角分辨光发射;表面电子现象金属-半导体界面;

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