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Effect of built-in electric field on electron Raman scattering in InGaN/GaN coupled quantum wells

机译:内置电场对InGaN / GaN耦合量子阱中电子拉曼散射的影响

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摘要

Electron Raman scattering (ERS) in wurtzite In_xGaN_(1_x)/GaN coupled quantum wells (CQWs) is investigated by effective-mass approximation and second-perturbation approach, including a strong built-in electric field (BEF) effect due to the piezoelectricity and spontaneous polarization. The dependence of differential cross-section (DCS) on structural parameters of CQWs is studied. Our results show that the strong BEF gives rise to a remarkable reduction of the DCS, which is around three orders smaller than that of the CQWs without BEF. With the presence of the BEF, the emitted photon energy decreases about 10 times as a consequence of quantum-confined Stark effect.
机译:通过有效质量近似和二次扰动方法研究了纤锌矿型In_xGaN_(1_x)/ GaN耦合量子阱(CQWs)中的电子拉曼散射(ERS),包括由于压电效应而产生的强内置电场(BEF)效应。自发极化。研究了微分截面(DCS)对CQW结构参数的依赖性。我们的结果表明,强大的BEF导致DCS的显着降低,这比不带BEF的CQW减小了约三个数量级。在存在BEF的情况下,由于量子限制的斯塔克效应,所发射的光子能量降低了约10倍。

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