Influence of substrate temperature on structural and optical properties of bismuth oxide thin films deposited by close-spaced vacuum sublimation

摘要

Bi_2O_3 thin films were deposited on ultrasonically-cleaned glass and mica substrates by close-spaced vacuum sublimation technique. Films surface morphology was studied using scanning electron microscopy (SEM). Structural study based on the transmission-electron microscopy (TEM) and selected-area electron diffraction (SAED) analysis has been shown that deposited films were polycrystalline with face-centered cubic structure. Optical study was carried out by spectral photometry analysis in the wavelengths range λ = 320-900 nm using the optical transmittance and absorbance measurements. For determination optical band gap E_g the Tauc plot was used and the band gap energy E_g is determined in the range of 3.50-3.62 eV, respectively. Fourier-transform infra-red (FTIR) analysis shown that obtained films are well-crystalline and have a good optical quality.