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首页> 外文期刊>IEEE Journal of Solid-State Circuits >NV-SRAM: a nonvolatile SRAM with backup ferroelectric capacitors
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NV-SRAM: a nonvolatile SRAM with backup ferroelectric capacitors

机译:NV-SRAM:具有备用铁电电容器的非易失性SRAM

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This paper demonstrates new circuit technologies that enable an0.25-Μm ASIC SRAM macro to be nonvolatile with only a 17% cell-areanoverhead. New capacitor-on-metal/via-stacked-plug process technologiesnpermit a nonvolatile SRAM (NV-SRAM) cell to consist of a six-transistornASIC SRAM cell and two backup ferroelectric capacitors stacked over thenSRAM portion. READ and WRITE operations in this NV-SRAM cell are verynsimilar to those of a standard SRAM, and this NV-SRAM shares almost allnthe circuit properties of a standard SRAM. Because each memory cell cannperform STORE and RECALL individually, both can execute massive-parallelnoperations. A Vdd/2 plate-line architecture makes READ/WRITEnfatigue negligible. A 512-byte test chip was successfully fabricated tonshow compatibility with ASIC technologies
机译:本文演示了新的电路技术,该技术使0.25μm的ASIC SRAM宏能够以仅17%的单元面积开销实现非易失性。新的金属上电容器/堆叠式插拔工艺技术允许非易失性SRAM(NV-SRAM)单元由一个六晶体管的ASIC SRAM单元和两个堆叠在SRAM部分之上的备用铁电电容器组成。该NV-SRAM单元中的读和写操作与标准SRAM的读和写操作非常相似,并且该NV-SRAM几乎共享标准SRAM的全部电路特性。因为每个存储单元都不能单独执行STORE和RECALL,所以两者都可以执行大规模并行操作。 Vdd / 2板线结构使READ / WRITEnfatigue可以忽略不计。成功制造出512字节的测试芯片,与ASIC技术兼容

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