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首页> 外文期刊>IEEE Journal of Solid-State Circuits >Circuit approaches to increasing IGBT switching speed
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Circuit approaches to increasing IGBT switching speed

机译:提高IGBT开关速度的电路方法

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摘要

Circuit techniques which greatly speed up the turn-off process of the insulated-gate bipolar transistor (IGBT) are presented. The circuits apply voltage to an external capacitor while the IGBT is in the ON state, and use this voltage to extract the excess charge stored in the base region of the device when the gate is turned off. An n/sup +/ diffusion has been added to the n/sup -/ base to facilitate this extraction. The circuitry does not affect the intrinsic ON resistance of the IGBT and thus avoids the usual ON-resistance/switching-speed trade-off. The area associated with the n/sup +/ diffusion adds to the area of the IGBT, and thus increases the specific ON resistance of the device. Test devices have been fabricated and turn-off times of 500 ns have been achieved.
机译:提出了可大大加快绝缘栅双极型晶体管(IGBT)关断过程的电路技术。当IGBT处于导通状态时,电路将电压施加到外部电容器,并在栅极关闭时使用该电压提取存储在器件基区中的多余电荷。已将n / sup + /扩散添加到n / sup-/碱基以促进此提取。该电路不会影响IGBT的固有导通电阻,因此避免了通常的导通电阻/开关速度之间的折衷。与n / sup + /扩散相关的面积增加了IGBT的面积,从而增加了器件的比导通电阻。已经制造出测试设备,并且已经达到500 ns的关断时间。

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