Investigation of cell-level potential-induced degradation mechanisms on perovskite, dye-sensitized and organic photovoltaics

摘要

The study focuses on the effect of bias voltage degradation or Potential Induced Degradation (PID) on the efficiency of perovskite (PSCs), dye-sensitized (DSSCs) and organic (OPVs) solar cells. For the PID study, voltage depended and time-depended degradation tests have been carried out at solar cell level; the cells were fabricated and tested in the same conditions. Furthermore, the solar cells were exposed to both, annealing and cooling tests in order tp highlight the various PID characteristics. Thus, the mechanisms induced during the PID degradation were thoroughly investigated. Results revealed that DSSCs are far more vulnerable to voltage degradation than other solar cell technologies. The current work illustrates that OPV solar cells can be considered as voltage durable compared to PSCs and DSSCs ones. OPV solar cells lost 23% of their initial efficiency whereas PSC and DSSC cells were entirely degraded after the application of 5.5 V and 2.5 V voltage respectively. Furthermore, in contrast to OPV, DSSCs and PSCs did not exhibit charging effect when a 5 V voltage was applied.