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How detrimental is coincidental correctness to coverage-based fault detection and localization? An empirical study

机译:基于覆盖的故障检测和定位是如何巧合的恰当的正确性如何? 实证研究

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According to the reachability-infection-propagation (RIP) model, three conditions must be satisfied for program failure to occur: (1) the defect's location must be reached, (2) the program's state must become infected and (3) the infection must propagate to the output. Weak coincidental correctness (or weak CC) occurs when the program produces the correct output, while condition (1) is satisfied but conditions (2) and (3) are not satisfied. Strong coincidental correctness (or strong CC) occurs when the output is correct, while both conditions (1) and (2) are satisfied but not (3). The prevalence of CC was previously recognized. In addition, the potential for its negative effect on spectrum-based fault localization (SBFL) was analytically demonstrated; however, this was not empirically validated. Using Defects4J, this paper empirically studies the impact of weak and strong CC on three well-researched coverage-based fault detection and localization techniques, namely, test suite reduction (TSR), test case prioritization (TCP) and SBFL. Our study, which involved 52 SBFL metrics, provides the following empirical evidence. (i) The negative impact of CC tests on TSR and TCP is very significant. In addition, cleansing the CC tests was observed to yield (a) a 100% TSR defect detection rate for all subject programs and (b) an improvement of TCP for over 92% of the subjects. (ii) The impact of CC tests on SBFL varies widely w.r.t. the metric used. The negative impact was strong for 11 metrics, mild for 37, non-measurable for 1 and non-existent for 3 metrics. Interestingly, the negative impact was mild for the 9 most popular and/or most effective SBFL metrics. In addition, cleansing the CC tests resulted in the deterioration of SBFL for a considerable number of subject programs. (iii) Increasing the proportion of CC tests has a limited impact on TSR, TCP and SBFL. Interestingly, for TSR and TCP and 11 SBFL metrics, small and large proportions of CC tests are strongly harmful. (iv) Lastly, weak and strong CC are equally detrimental in the context of TSR, TCP and SBFL.
机译:根据可达性 - 感染 - 传播(RIP)模型,必须满足三种条件对程序发生故障:(1)必须达到缺陷的位置,(2)程序的状态必须受到感染和(3)感染必须传播到输出。当程序产生正确的输出时,会发生弱巧合的正确性(或弱CC),而条件(1)满足,但不满足条件(2)和(3)。当输出正确时,会发生强巧合的正确性(或强CC),而条件(1)和(2)则满足但不是(3)。先前认识到CC的患病率。此外,分析证明了对基于频谱的故障定位(SBFL)的负面影响的可能性;但是,这不是经验验证的。使用缺陷4J,经验凭经验研究了弱和强度CC对三种研究的基于覆盖率的故障检测和定位技术的影响,即测试套件减少(TSR),测试案例优先级(TCP)和SBFL。我们涉及52个SBFL指标的研究提供了以下实证证据。 (i)CC测试对TSR和TCP的负面影响非常显着。此外,尚未观察到CC测试以产生(a)所有受试者程序的100%TSR缺陷检测率,(b)在92%的受试者中提高TCP。 (ii)CC测试对SBFL的影响范围广泛W.r.t.使用的指标。对于11个度量,37,37,37的不可衡量,3个度量,负面影响强烈。有趣的是,对于9个最受欢迎和/或最有效的SBFL指标,对9的负面影响是轻微的。此外,清洁CC测试导致SBFL的恶化以获得相当数量的主题程序。 (iii)增加CC测试的比例对TSR,TCP和SBFL的影响有限。有趣的是,对于TSR和TCP和11个SBFL度量,小而大的CC测试的比例都很有害。 (iv)最后,在TSR,TCP和SBFL的背景下,弱和强的CC同样有害。

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