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Improving Bias Stability of Micromachined Accelerometer by Increasing Mechanical Stability

机译:通过提高机械稳定性来提高微机械加速度计的偏置稳定性

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摘要

In this paper, the bias stability of a micromachined accelerometer is improved by increasing the mechanical stability. The mechanical stability is increased by increasing the stiffness of the parallel plate electrodes of the accelerometer structure. Through this work, we experimentally show that there is a relationship between the bias stability and the mechanical stability of the accelerometer structure. We designed and fabricated two models with different mechanical stabilities. The two models of the accelerometer were designed by ANSYS modal analysis and MATLAB analysis. Silicon on glass (SiOG) substrate is used in the proposed accelerometers. Therefore, the single-crystalline silicon was used as a device layer and the glass wafer was used as a handling layer. The measured bias stability of the fabricated accelerometers was improved from 500 mg to 4.4 mg with the same sensing circuit.
机译:本文通过提高机械稳定性来改善微机械加速度计的偏置稳定性。通过增加加速度计结构的平行板电极的刚度来提高机械稳定性。通过这项工作,我们实验证明了加速度计结构的偏置稳定性和机械稳定性之间存在关系。我们设计和制造了两个具有不同机械稳定性的模型。通过ANSYS模态分析和MATLAB分析设计了两种加速度计模型。建议的加速度计使用玻璃上硅(SiOG)基板。因此,将单晶硅用作器件层,并将玻璃晶片用作处理层。在相同的感应电路下,所制造的加速度计的偏置稳定性已从500 mg提高到4.4 mg。

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