Systematic Characterization of Dual Probes for Electromagnetic Near-Field Measurement

摘要

In this paper, systematic characterization of the dual probe, which is designed for the near field simultaneous measurement of both electric and magnetic field, is investigated with a microstrip line as the device under test (DUT). The characterization includes frequency response, transmission performance, symmetry, reflection, the intrusion of probe to the DUT, isolation of electric and magnetic field responses, field profile and spatial resolution, and differential electric field suppression. The dual probes with different design are adopted to demonstrate the systematic characterization.