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首页> 外文期刊>IEEE sensors journal >A Robust Low Power Carbon Nanotube Sensor Interface Circuit in 180 nm CMOS Technology
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A Robust Low Power Carbon Nanotube Sensor Interface Circuit in 180 nm CMOS Technology

机译:采用180 nm CMOS技术的强大的低功耗碳纳米管传感器接口电路

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摘要

The design and performance of a low-cost, energy-efficient carbon nanotube sensor interface circuit (SIC) is presented that is aimed at deployable/expendable applications with the sensor operating at ambient temperatures. The submicrometer SIC is designed and fabricated in CMOS 180-nm technology and consumes a maximum of 122 $mu{rm W}$, including a decoder and voltage follower. The SIC achieves a measurement accuracy of 1.4% over a 2.5 ${rm k}Omega$ to 25 ${rm M}Omega$ dynamic range of sensor resistance. A critical issue associated with a submicrometer integrated circuit implementation is satisfactory performance of the SIC for fabrication process variations that range from the slow, to typical, to fast process corners and simultaneously meeting the requirement for the very large dynamic range for sensor resistances. A robust design considering the full range of potential process variations becomes more critical as feature size is reduced. The SIC design includes an added degree for freedom for counteracting process variations during post fabrication calibration. In addition, a new design procedure is outlined and implemented to permit an accurate and efficient first order design to ensure satisfactory performance for typical, fast, and slow model parameters. The first order design is verified by complete model simulation performance, and finally selected measured results are included for a fabricated circuit.
机译:提出了一种低成本,高能效的碳纳米管传感器接口电路(SIC)的设计和性能,该传感器旨在可部署/消耗性应用,且传感器在环境温度下运行。亚微米SIC采用CMOS 180 nm技术设计和制造,最多消耗122个 $ mu {rm W} $ ,包括解码器和电压跟随器。 SIC在2.5 $ {rm k} Omega $ 到25 $ {rm M} Omega $ 传感器电阻的动态范围。与亚微米集成电路实现相关的一个关键问题是SIC对于制造工艺变化的令人满意的性能,该变化的变化范围从缓慢的,典型的到快速的工艺拐角,同时满足传感器电阻的很大动态范围的要求。随着特征尺寸的减小,考虑潜在工艺变化的全部范围的稳健设计变得更加关键。 SIC设计包括增加的自由度,以抵消制造后校准期间的工艺变化。此外,概述并实施了新的设计程序,以允许进行准确而有效的一阶设计,以确保对典型,快速和慢速模型参数具有令人满意的性能。一阶设计已通过完整的模型仿真性能进行了验证,最后包括了所制造电路的选定测量结果。

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