...
首页> 外文期刊>Sensors and Actuators >Temperature influence on pH-ISFET sensor operating in weak and moderate inversion regime: Model and circuitry
【24h】

Temperature influence on pH-ISFET sensor operating in weak and moderate inversion regime: Model and circuitry

机译:温度对在弱反转模式下运行的pH-ISFET传感器的影响:模型和电路

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Usually most pH-ISFET readout circuits, with temperature compensation, were designed using transistors operating in strong regime. However, a classes of circuits elaborated with respect to MOS weak inversion are also very suitable for low-voltage and low-power applications. In this work, we discuss the problem of temperature variation at the sensor and circuit level. An analysis was made of the sensor operating in weak and moderate inversion regime. It has been shown that a simplified version of the EKV model combined with site-binding model can describe the behavior of ISFET toward the temperature and pH change. The experimental results agree very well with the analytical model for devices in large intervals of pH and temperature. Finally, the usage of model development is considered with an original concept of a readout circuit. The result of the simulation shows that the output signal is linear with pH, the design technique permits improving temperature insensitivity. The proposed circuit can be integrated with an ISFET by standard CMOS technology.
机译:通常,大多数带有温度补偿的pH-ISFET读出电路都是使用工作在强状态的晶体管设计的。但是,针对MOS弱反相精心设计的一类电路也非常适合低压和低功率应用。在这项工作中,我们讨论了传感器和电路级温度变化的问题。分析了传感器在弱反转模式下的运行情况。已经表明,EKV模型的简化版本与位点绑定模型结合可以描述ISFET对温度和pH值变化的行为。实验结果与在较大的pH和温度间隔下的设备的分析模型非常吻合。最后,将模型开发的使用与读出电路的原始概念一起考虑。仿真结果表明,输出信号与pH呈线性关系,该设计技术可以改善温度不敏感度。所提出的电路可以通过标准CMOS技术与ISFET集成。

著录项

  • 来源
    《Sensors and Actuators》 |2014年第10期|1019-1027|共9页
  • 作者单位

    'SDMN Team', National School of Applied Sciences, BP 669, Oujda 60000, Morocco;

    'SDMN Team', National School of Applied Sciences, BP 669, Oujda 60000, Morocco;

    CNRS, LAAS, 7 Avenue du Colonel Roche, F-31400 Toulouse, France ,University of Toulouse UPS LAAS F-31400 Toulouse, France;

    CNRS, LAAS, 7 Avenue du Colonel Roche, F-31400 Toulouse, France ,University of Toulouse UPS LAAS F-31400 Toulouse, France;

    CNRS, LAAS, 7 Avenue du Colonel Roche, F-31400 Toulouse, France ,University of Toulouse UPS LAAS F-31400 Toulouse, France;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    PH-ISFET; EKV-model; Weak inversion; Thermal drift; Readout circuit;

    机译:PH-ISFET;EKV模型弱反演热漂移;读出电路;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号