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dV/dt effect in high-voltage 4H-SiC thyristors

机译:高压4H-SiC晶闸管中的dV / dt效应

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The switching of high-voltage (1.5 kV) 4H-SiC thyristors by the dV/dt effect has been investigated for the first time in the temperature range from 300 to 504 K. At a rise time of the forward bias V(t) equal to 30 ns, the characteristic bias at which the structure under investigation can be switched on by the dV/dt effect decreases steadily from 289 V at room temperature (dV/dt similar to 9.7 kV mu s(-1)) to 137 V at T = 504 K. The characteristic value of the critical charge per unit area, Q(cr), is similar to 1-9 X 10(-7) C cm(-2) at room temperature and also decreases steadily as the temperature increases.
机译:在300至504 K的温度范围内,首次研究了由dV / dt效应引起的高压(1.5 kV)4H-SiC晶闸管的开关。在正向偏置电压V(t)上升的时间相等在30 ns到30 ns的时间内,通过dV / dt效应可以开启被研究结构的特性偏置从室温下的289 V(类似于9.7 kV mu s(-1)的dV / dt)稳步降低到137V。 T = 504K。在室温下,每单位面积的临界电荷的特征值Q(cr)类似于1-9 X 10(-7)C cm(-2),并且随着温度的升高而稳定降低。

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