首页> 外文期刊>Semiconductor Science and Technology >Experimental study on magnetoresistance phenomena in n-type Si/SiGe quantum wires
【24h】

Experimental study on magnetoresistance phenomena in n-type Si/SiGe quantum wires

机译:n型Si / SiGe量子线中磁阻现象的实验研究

获取原文
获取原文并翻译 | 示例
           

摘要

The resistance of a quasi-ballistic wire fabricated in a high-mobility n-type Si/SiGe heterostructure is studied as a function of magnetic field in the temperature range 0.1 K-4.2 K. The wire has a length of 10 μm and a nominal width of 400 nm. When the magnetic field is increased from 0 T to 10 T we observe weak localization, reproducible resistance fluctuations and Shubnikov--de Haas oscillations. The various effects are superimposed on a background resistance showing the influence of diffuse sidewall scattering. All these effects are separated and analysed to give a quantitative and consistent picture of the electron transport. The magnitude of the various measured transport parameters indicates that the electron transport is quasi-ballistic. Size effects due to the influence of the confining boundary potential are observed and accounted for in the theoretical descriptions.
机译:研究了在高迁移率n型Si / SiGe异质结构中制造的准弹道线的电阻与温度在0.1 K-4.2 K范围内的磁场的关系。该线的长度为10μm,标称值为宽度为400 nm。当磁场从0 T增加到10 T时,我们观察到弱的局部性,可再现的电阻波动和Shubnikov-de Haas振荡。各种效应叠加在背景电阻上,显示出扩散侧壁散射的影响。分离并分析所有这些作用,以给出电子传输的定量且一致的图像。各种测得的传输参数的大小表明,电子传输是准弹道的。在理论描述中观察并解释了由于限制边界电势的影响而引起的尺寸效应。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号